SEM-EDS

(Scanning Electron Microscope with Energy Dispersive x-ray Spectroscopy)

Donated by Dow-Corning, Midland MI

Dr. Wright with former student Jordan Ernst (Chemistry '11, now a Ph.D. student in analytical chemistry at Univ. of Michigan)

Our JOEL 6100 Scanning Electron Microscope is a convnetional high vacuum SEM, equipped with a LaB6 cathode, a secondary electron detector (topographic imaging), a segmented backscatter detector (compositional imaging), and a Noran Vantage EDS detector (elemental analysis) and digital imaging system.

Our SEM is used for a vairety of purposes including high resolution imaging, mineral analysis, forensic analysis (fibers, GSR, particles), analysis of electrical componenets, etc.

 

 

UL: Conodont Element, UM Diatom, UR: Printed Circuit Board with carbon deposits (backscatter image)

LL: Mosquito Proboscis, LM: Tungston Light Bulb Filament, LR: Feather

 


SEM-EDS is also useful for making two dimensional maps of element distribution in geologic specimens